Tapping Mode AFM Probe

Tapping Mode (Dynamic Mode AFM)

Tapping mode is one of the most commonly used Atomic Force Microscopy (AFM) techniques, where the cantilever oscillates near its resonance frequency and intermittently contacts the sample. This reduces lateral forces and minimizes sample damage, making it ideal for imaging soft materials such as polymers and biological samples.

LprobeTapping40_Al-Si-30
$300,00 $1230,00Price range: $300,00 through $1230,00 Select options This product has multiple variants. The options may be chosen on the product page
LprobeTapping20_Al-Si-30
$300,00 $1200,00Price range: $300,00 through $1200,00 Select options This product has multiple variants. The options may be chosen on the product page

^{Lprobe® and XLprobe® are registered trademarks of Vmicro SAS
ScanAsyst® is a registered trademark of Bruker Corporation
PeakForce Tapping® is a trademark of Bruker Corporation
WaveMode™ is a proprietary mode of Nanosurf
True Non-Contact™ is a trademark of Park Systems Corp}

Tapping Mode AFM Probe

LprobeTapping40_Al-Si-30

LprobeTapping20_Al-Si-30