Lprobes® - AFM Probes based on patented in-plane silicon technology

AFM Probes shop

by Application

Conductive

Electrical measurements

s-SNOM

s-SNOM imaging

Plaftorm Cantilever

tilt compensated flat surface

Test sample shop

Lprobe® and XLprobe® are registered trademarks of Vmicro SAS
ScanAsyst® is a registered trademark of Bruker Corporation
PeakForce Tapping® is a trademark of Bruker Corporation
WaveModeis a proprietary mode of Nanosurf
True Non-Contact™ is a trademark of Park Systems Corp