PC040_Au-Si_20

Features

  • 11° Tilt Compensated platform cantilever
  • 20×20µm Flat end parallel to the sample
  • 20µm long shaft

Applications

  • Microsphere gluing
  • Uniform, angle-compensated contact for pressure-controlled measurements
  • Cell attachement
PackagingPrice & quantity
10 AFM probes

1 box of 10 probes
unit price 30€

$330,00
20 AFM probes

2 boxes of 10 probes
unit price 27.5€ = 8% discount

$600,00
50 AFM probes

1 box of 50 probes
unit price 24.6€ = 18% discount

$1350,00
→ You can generate a quote directly from the cart page
Order code : PC040_Au-Si_20

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
180
100-300
Spring constant
N/m
40
20-60
Tip height Ht
µm
20
N/A
Tip apex radius
nm
20x20µm
+/-5%
Tip side angle θ
°
180
+/- 0.5
Tip-cantilever angle α
°
110
+/- 0.5
Cantilever length Lc
µm
150
+/- 1
Cantilever Width Wc
µm
20
+/- 1
Cantilever Thickness Tc
µm
5.4
+/- 0.5
Cantilever backside coating
Gold
Tip side coating
Uncoated
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

  • 11° Tilted flat-end platform
  • 20µm long pedestal
  • 20×20µm flat surface parallel to the sample

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)

Find probes by application

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Electrical measurements

s-SNOM

s-SNOM Probes for IR

Platform Cantilevers

Tilt compensated flat surface