LS003_Pt-Pt_30

Features

  • New MEMS technology unlocking probe engineering
  • Long tip reduces cantilever artifacts in electrical modes
  • Cone angle and tip-cantilever angle unlocked and chosen by design
  • TrueTipView: Precise tip visibility enables accurate landing on sample
  • Vertical sidewalls probe chip for easy handling

Applications

  • Electrical modes
    • Electrostatic Force Microscopy (EFM)
    • Kelvin Probe Force Microscopy (KPFM)
PackagingPrice & quantity
10 AFM probes

1 box of 10 probes
unit price 25€

250,00 
20 AFM probes

2 boxes of 10 probes
unit price 23€ = 8% discount

460,00 
50 AFM probes

1 box of 50 probes
unit price 22€ = 12% discount

1100,00 
Metal Box of 10 AFM Probes

High-quality gel-free packaging
unit price 55€

550,00 
→ You can generate a quote directly from the cart page
Order code : LS003_Pt-Pt_30

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
90
50-150
Spring constant
N/m
3
1-8
Tip height Ht
µm
30
15-50
Tip apex radius
nm
25
20-35
Tip side angle θ
°
15
+/- 0.5
Tip-cantilever angle α
°
118
+/- 0.5
Cantilever length Lc
µm
115
+/- 1
Cantilever Width Wc
µm
40
+/- 1
Cantilever Thickness Tc
µm
1.4
+/- 0.5
Cantilever backside coating
Platinum
Tip side coating
Platinum
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

Lprobe conductive
  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Reduces cantilever cross talk in electrical modes
  • Half-cone angle < 10° over the last 10 µm
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Conductive Tip
    Conductive platinum layer all faces of the tip, typical apex radius is 25nm

 

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)

Find probes by application

Conductive

Electrical measurements

s-SNOM

s-SNOM Probes for IR

Platform Cantilevers

Tilt compensated flat surface