LF020_Pd-Si_15

Applications

  • Fast topography imaging in oscillating modes
    • Tapping mode
    • Non-contact mode
    • WavemodeTM
  • Roughness measurements
  • Nanoscale imaging on highly corrugated samples
  • Challenging aspect ratios
PackagingPrice & quantity
10 AFM probes

1 box of 10 probes
unit price 35€

$4000,00
→ You can generate a quote directly from the cart page
Order code : LF020_Pd-Si_15

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
1500
1200-2000
Spring constant
N/m
20
10-50
Tip height Ht
µm
15
05-60
Tip apex radius
nm
7
2-10
Tip side angle θ
°
22
+/- 0.5
Tip-cantilever angle α
°
112
+/- 0.5
Cantilever length Lc
µm
40
+/- 1
Cantilever Width Wc
µm
10
+/- 1
Cantilever Thickness Tc
µm
0.65
+/- 0.5
Cantilever backside coating
Palladium
Tip side coating
Uncoated
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

Lprobe fast
  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Enables imaging of deeper or difficult-to-access sample regions.
  • Half-cone angle < 10° over the last 10 µm 
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Guaranteed tip radius < 10 nm
    Provides reliable resolution for advanced AFM applications.

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)

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Platform Cantilevers

Tilt compensated flat surface