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Features

  • New MEMS technology
  • Long tip:extends AFM capabilities
  • Highly profiled tip with angle engineering
  • Tip visibility provides accurate landing
  • Vertical sidewall chip for safe handling

Applications

  • Topography imaging in oscillating modes
    • Tapping mode
    • Non-contact mode
    • True non-contactTM
  • Olympus AC160 characteristics
  • Roughness measurements
  • Nanoscale imaging on highly corrugated samples
  • Challenging aspect ratios
PackagingPrice & quantity
Box of 10 AFM Probes

clique ici

 280,00 €
Box of 20 AFM Probes

Volume Discount: 10%

 500,00 €
Box of 50 AFM Probes

Volume Discount 20%

 1150,00 €
→ You can generate a quote directly from the cart page
Order code : LT040_Al-Si-30

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
300
200-350
Spring constant
N/m
40.0
24-55
Tip height
µm
30
15-50
Tip apex radius
nm
7
2-10
Tip side angle
.
7
+/- 0.5
Tip-cantilever angle
.
7
+/- 0.5
Cantilever length L
µm
115
+/- 1
Cantilever Width W
µm
40
+/- 1
Cantilever Thickness T
µm
3.3
+/- 0.5
Cantilever backside coating
Aluminum
Tip side coating
Uncoated
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

LprobeTapping40_Al-Si-30
  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Enables imaging of deeper or difficult-to-access sample regions.
  • Half-cone angle < 10° over the last 10 µm 
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Guaranteed tip radius < 10 nm
    Provides reliable resolution for advanced AFM applications.

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)

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