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Features

  • New MEMS technology
  • Long tip: extends AFM capabilities
  • Highly profiled tip with angle engineering
  • Tip visibility provides accurate landing
  • Vertical sidewall chip for safe handling

Applications

  • Topography imaging in oscillating modes
    • Tapping mode
    • Non-contact mode
    • True non-contactTM
  • Roughness measurements
  • Nanoscale imaging on highly corrugated samples
  • Challenging aspect ratios
PackagingPrice & quantity
Box of 10 AFM Probes
 280,00 €
Box of 20 AFM Probes

Volume discount: 11%

 500,00 €
Box of 50 AFM Probes

Volume discount: 18%

 1150,00 €
→ You can generate a quote directly from the cart page
Order code : LT020_Al-Si-100

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
110
80-150
Spring constant
N/m
20
8-30
Tip height Ht
µm
100
80-120
Tip apex radius
nm
8
5-20
Tip side angle θ
°
8
+/- 0.5
Tip-cantilever angle α
.a°
8
+/- 0.5
Cantilever length Lc
µm
115
+/- 1
Cantilever Width Wc
µm
40
+/- 1
Cantilever Thickness Tc
µm
2.8
+/- 0.5
Cantilever backside coating
Aluminum
Tip side coating
Uncoated
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Enables imaging of deeper or difficult-to-access sample regions.
  • Half-cone angle < 10° over the last 10 µm 
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Guaranteed tip radius < 10 nm
    Provides reliable resolution for advanced AFM applications.

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)