s-SNOM probes for imaging and spectroscopy

Scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) is a high-resolution technique that uses an AFM tip as an optical antenna to probe materials at the nanoscale. The tip is illuminated by a focused light source such as a laser, a broadband infrared or terahertz emitter, or synchrotron radiation. The scattered near-field signal is then detected to overcome the diffraction limit.

This approach enables nanoscale imaging of optical and electronic properties. It is widely used in nanophotonics, plasmonics, 2D materials, and infrared vibrational studies. The high sensitivity of s-SNOM allows quantitative analysis of local dielectric functions, charge carrier distributions, and phonon–plasmon interactions with nanometer precision.

All our s-SNOM probes are supplied in gel-free metal boxes to prevent any parasitic optical or chemical signals that could arise from polymer-based packaging materials.