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Features

  • New MEMS technology unlocking probe engineering
  • Long tip reduces cantilever artifacts in electrical modes
  • Cone angle and tip-cantilever angle unlocked and chosen by design
  • Precise tip visibility enables accurate landing on sample
  • Vertical sidewalls probe chip for easy handling

Applications

  • Electrical modes
    • Electrostatic Force Microscopy (EFM)
    • Kelvin Probe Force Microscopy (KPFM)
PackagingPrice & quantity
Box of 10 AFM Probes
 350,00 €
Box of 20 AFM Probes

Volume discount: 9%

 640,00 €
Box of 50 AFM Probes

Volume discount: 16%

 1470,00 €
→ You can generate a quote directly from the cart page
Order code : LT020_Pt-Pt-30

Specifications

Parameter
Unit
Nominal
Range
Frequency
kHz
250
150-300
Spring constant
N/m
20
8-30
Tip height Ht
µm
30
15-50
Tip apex radius
nm
25
20-35
Tip side angle θ
°
25
+/- 0.5
Tip-cantilever angle α
°
25
+/- 0.5
Cantilever length Lc
µm
115
+/- 1
Cantilever Width Wc
µm
40
+/- 1
Cantilever Thickness Tc
µm
2.8
+/- 0.5
Cantilever backside coating
Platinum
Tip side coating
Uncoated
Tip and cantilever material
p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions
mm
3.4x1.6x0.4

Cantilever & tip details

LprobeTapping20_COND_Pt-Pt-30
  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Reduces cantilever cross talk in electrical modes
  • Half-cone angle < 10° over the last 10 µm
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Conductive Tip
    Conductive platinum layer all faces of the tip, typical apex radius is 25nm

 

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)